Chipmetrics

🌍We're excited to participate in two major conferences next week—highlighting our latest research in thin-film metrology. 📍 EURO CVD & ALD 2024 🗓️ June 2–5 | Monastery of San Nicolò, Catania, Italy 🎤 Jussi Kinnunen, General Manager at Chipmetrics, will deliver an oral presentation: 🎙️ "Bottleneck-Effect on High Aspect Ratio ALD Thin-Film Conformality" 📍 Optics & Photonics Days 2025 🗓️ June 3–5 | Oulu Music Center, Oulu, Finland 🔬 Jani Karttunen, Head of Product Management at Chipmetrics, will present a poster: 🖼️ "Ellipsometry to Resolve the Thickness of Ultra-Thin Films in a Stack with Micrometre Scale Lateral Resolution" If you're attending either event, don’t miss the chance to connect with our experts! #Chipmetrics #ALDep #PillarHall #Chipmetrified #TestedWithPillarHall #ThinFilmMetrology #OpticsAndPhotonics #EUROCVDALD24

Proud to see our PillarHall Lateral high aspect ratio (LHAR) test chip featured in the Park Systems ISE Image Gallery! This high-resolution Delta Map reveals the exceptional conformality of ALD-deposited Al₂O₃ inside PillarHall LHAR structure. The image demonstrates precise film penetration depth analysis using Imaging Spectroscopic Ellipsometry (ISE), with 1 µm lateral resolution. 🔬 Why it matters: ✔️ Validates conformality in challenging 3D geometries ✔️ Accelerates ALD process development ✔️ Enables predictive insight for deposition in next-gen devices like 3D NAND and DRAM Partnering advanced metrology with application-specific test structures, Chipmetrics provides unmatched solutions for ALD process control and thin film characterization. 🔗 View the full Park Systems ISE Image Gallery from the link in the comment section 👇 #ALDep #PillarHall #TestedWithPillarHall #Chipmetrified #ParkSystems #3DNAND #DRAM #Nanotechnology #Semiconductors #Ellipsometry

📢 Semicon SEA kicked off in Singapore today, with our CTO Feng Gao flying the Chipmetrics flag. He will be roaming the expo floors until Thursday, reach out to him if you wish to learn more about our metrology solutions. #aldep #semiconsea #singapore #semiconductors #PillarHall #Chipmetrified

🔬 Exciting Research Presentation at EMRS Spring 2025 symposium! We’re thrilled to see Dr. Anish Philip from Aalto University presenting his latest research at EMRS 2025 in Symposium L11: Thin Film Batteries. 📅 Date: 28 May 2025 🕐 Time: 13:45–15:30 📍 Room: Symposium L 🎓 Presentation title: Role of lithium precursors in tuning conformality of potential 3D thin-film microbattery components In this study, Dr. Philip and his team explored the impact of various lithium precursors on the conformality and film properties of LiPON and Li-TP – two highly promising materials for 3D thin-film microbatteries. To measure conformality and penetration depth, the team used our PillarHall® lateral high-aspect-ratio test structures, along with SEM and imaging ellipsometry techniques. Their findings reveal the choice of lithium precursor plays a critical role in both conformality and film properties. 👏 We’re proud that PillarHall played a key role in enabling conformality analysis in this impactful work. 📢 Don't miss the presentation if you're attending EMRS 2025 symposium! #TestedWithPillarHall #PillarHall #Chipmetrified #ALDep #EMRS2025

🎉 We’re thrilled to welcome Stefan Polzin as our new Chief Operating Officer at Chipmetrics! With a Master's in Electrical Engineering and an Executive MBA, his extensive experience across semiconductor manufacturing and packaging makes him a fantastic addition to our team. "I'm excited to dive into operational business and truly understand our customers' needs in the pocket wafer space," he says – get to know Stefan better on our blog 👇 Link in the first comment. Welcome aboard, Stefan! We look forward to a bright future together! 🌟 #Welcome #Semiconductors #ALDep #NewHire #Chipmetrified

📢 Our CEO Mikko Utriainen and Head of Metrology Wafer Business Thomas Werner recently joined Alexander Türpe’s podcast to talk about deep tech entrepreneurship, scaling a startup, and what it's like building Chipmetrics across Finland and Germany. From founding stories to remote leadership, this episode offers an honest look behind the scenes of a fast-growing startup in the semiconductor industry. Check out the full episode from the link in the first comment 👇 #DeepTech #Semiconductors #Startups #Leadership #Chipmetrics #ALDep #Founders

📢 We’re excited to announce that our CEO, Dr. Mikko Utriainen, will give a presentation at the SMC Korea 2025 event! 🗓 Date: Wednesday, May 14, 2025 🕒 Time: 15:50–16:20 (Session 2: The Future of Semiconductor Materials) 📍 Venue: Convention Hall 2, 3F, Suwon Convention Center 🎤 Presentation Title: Advancing ALD Tool Qualification for 3D Memory Devices Using High-Aspect-Ratio Test Structures. As the semiconductor industry scales further into 3D memory architectures like 3D DRAM and NAND, ensuring ultra-thin film quality becomes increasingly critical. In this talk, Dr. Utriainen will highlight how our lateral high-aspect-ratio (LHAR) test structures enable sensitive ALD process monitoring and tool benchmarking, offering fabs a practical solution to improve process stability, yield, and tool-to-tool comparability. 🔬 Join us to explore how HAR metrology is reshaping ALD qualification for next-generation semiconductor manufacturing! 📩 Interested in learning more or discussing collaboration opportunities? Book a meeting with Mikko Utriainen during SMC Korea by sending an email to: 👉 info@chipmetrics.com We’d be happy to schedule a time that works for you! #SMC2025 #Semiconductor #ALDep #PillarHall #TestedWithPillarHall #Chipmetrified

🚨 You're Invited! 🚨 Chipmetrics is hosting an exclusive 3D Thin Film Metrology Workshop on June 26, 2025, right after the ALD/ALE Conference — and we hope to see you there! 📍 Location: Parnas Hotel, Jeju Island, South Korea 🗓 Date: June 26, 2025 Join researchers, engineers, and industry professionals for a full day of: ✅ Keynote presentations on 3D thin film process control ✅ Hands-on training with PillarHall® test chips ✅ Expert talks on conformality measurement challenges ✅ Roundtable discussions and valuable networking 🎟️ Seats are limited – register now from the link in the first comment 👇 #ALDep #PillarHall #ALDALE2025 #Chipmetrified #TestedWithPillarHall

🚀Accelerate your CMOS Image Sensor (CIS) development with smarter ALD process control! Atomic Layer Deposition (ALD) is critical in CIS manufacturing, but challenges like inconsistent thin-film coverage and slow optimization cycles can hinder progress. In our latest blog post, we show how the PillarHall® test chip helps to: ✅ Rapidly assess ALD conformality and step coverage ✅ Reduce process iteration time from months to days ✅ Improve sensor performance and time-to-market 📖 Read the full blog from the first link in the comment section 👇 #ALDep #CIS #TestedWithPillarHall #PillarHall #Chipmetrified #Semiconductor

PillarHall® test chips continue to prove their value in cutting-edge ALD research.🧪✨ In this insightful new blog post on AtomicLimits, our collaborators explore how PillarHall enables precise analysis of conformality in extreme high aspect ratio structures, supports understanding of diffusion and reaction regimes, and even study the influence of plasma ions on film growth. #ALDep #TestedWithPillarHall #PillarHall #Chipmetrified