Chipmetrics

📍 Live from ALD/ALE 2025! We’re excited to be part of ALD/ALE 2025, showcasing Chipmetrics’ cutting-edge thin-film metrology solutions right next to Park Systems ( #16 & #17 booths). 🔬We are featuring live PillarHall™ sample measurements using Park Systems’ Spectroscopic Imaging Ellipsometer – a great opportunity to see our lateral high aspect ratio test structures in action. Come explore what it means to be #Chipmetrified 🔍 #ALDep #PillarHall #ALDALE2025 #PillarHall #TestedWithPillarHall

🚀 Ready to kick off ALD/ALE 2025 in Jeju! Chipmetrics is all set at Booth #16 at the Jeju International Convention Center (ICC) for the ALD/ALE 2025 conference. The exhibition opens today, June 22nd at 6 PM – come meet us and discover our exciting new offerings including high surface area wafer, a new ASD chip for Area Selective Deposition studies, and pre-coated high aspect ratio test chips ! We’re excited to connect with the ALD community here in beautiful Jeju – see you soon! #ALDALE2025 #ALDep #TestedWithPillarHall #Chipmetrified #PillarHall

☀️Hyvää Juhannusta☀️ ☀️Happy Midsummer☀️ #PillarHall #ALDep #Chipmetrified

Thomas Werner, our Head of Metrology Wafer Business, will be representing Chipmetrics at the 3D & Systems Summit – Heterogeneous Integration: Bolstering Europe’s Resilience, taking place from 25–27 June 2025! 📍 Location: Hilton Dresden Hotel, Dresden, Germany This summit gathers industry leaders advancing 3D integration, advanced packaging, and heterogeneous system technologies. As a pioneer in 3D thin-film metrology, Chipmetrics supports the development of next-generation semiconductor devices with its innovative metrology chips and wafers. 👋 Let’s connect in Dresden! If you're attending, don’t hesitate to reach out to Thomas and learn how Chipmetrics can support your metrology and process control challenges. #ALDep #PillarHall #Semiconductor #Chipmetrified #Semi

📢 We're at Silicon Saxony Day today – world premiere for our 3D printed PillarHall model! Grab hold of Thomas Werner on the show floor if you wish to see it live. #ALDep #PillarHall #TestedWithPillarHall #Chipmetrified

🔬 Pushing the Boundaries of Spatial ALD with PillarHall® We're proud to see our PillarHall® test chips at the center of breakthrough research in spatial Atomic Layer Deposition (ALD), led by Mike van de Poll at Eindhoven University of Technology. Supervised by ALD pioneers Prof. Erwin Kessels and Dr. Bart Macco, Mike is exploring how spatial ALD—where reactants are separated in space rather than time—can accelerate deposition and open new doors for high-volume manufacturing in fields like batteries and solar cells. Using PillarHall chips, Mike and his team have revealed: ✅ How oxygen radicals behave at atmospheric pressure in plasma-enhanced ALD ✅ How pressure impacts film conformality in complex 3D structures ✅ Phase transitions of titanium oxide inside high-aspect-ratio trenches ✅ The influence of ions and UV photons in plasma processes ✅ Early insights into ternary oxides and precursor dosing strategies These findings are not just academic—they’re laying the groundwork for scalable, efficient, and tunable material processing in the next generation of energy devices. 👇 Read the full story from the link in the comments 👇 #ALDep #PillarHall #TestedWithPillarHall #Chipmetrified #ALDResearch

🚀 Meet Chipmetrics at ALD/ALE 2025 Conference in Jeju Island! 🌴 We’re excited to announce that Chipmetrics will be exhibiting at the ALD/ALE 2025 conference from June 22–25 in beautiful Jeju Island, South Korea! 🌏 📍 Visit us at Booth #16, right next to Advantec and Park Systems . ✨ Bring your PillarHall® test chips and stop by our booth to get live measurements using the EP4 Imaging Ellipsometer located at the Park Systems booth and meet the team behind the technology! 👋 Meet our team at the event: Mikko Utriainen, CEO Feng Gao, CTO Zahra Ghaderi, Marketing Manager 💬 Want to book a meeting with us during the event? Reserve your slot from the link in the comments 👇 Let’s talk ALD, and metrology innovation. See you in Jeju! #ALDALE2025 #Chipmetrics #PillarHall #ALDep #Metrology #Chipmetrified #TestedWithPillarHall

🔍 Our Picks Ahead of ALD 2025: Anticipating Atomic Layer Innovation in South Korea 🇰🇷 As ALD 2025 approaches, we’re thrilled to spotlight key presentations where our PillarHall™ test structures are helping researchers tackle the most pressing challenges in conformality, process stability, and 3D integration. This year’s conference highlights how metrology and innovation go hand in hand — from detecting process window shifts early, to understanding growth dynamics in ultra-high aspect ratio features. Several top presentations already feature Chipmetrics’ LHAR structures, and we couldn't be prouder to support this cutting-edge work. Explore our full list and why these presentations matter in our latest blog post: 🔗 Link in the comments 👇 📅 See you at Chipmetrics' booth #16 at ALD/ALE 2025! #ALDALE2025 #PillarHall #TestedWithPillarHall #ALDep #Chipmetrified

🚀 Chipmetrics at Silicon Saxony Day — June 17th, Dresden 🚀 We’re excited to announce that we will be attending Silicon Saxony Day next week on June 17th! This is one of Europe’s leading platforms for networking and exchanging ideas within the semiconductor and microelectronics community. Our team is eager to connect with industry leaders, explore the latest innovations, and discuss how advanced conformality analysis and ALD metrology solutions can drive the next wave of progress in semiconductor manufacturing. 🎯 Want to meet us in Dresden? Thomas Werner from Chipmetrics will be on site all day and would love to meet you! Whether you’re interested in cutting-edge ALD applications, collaboration opportunities, or simply want to learn more about what we do – reach out and connect with Thomas during the event. See you there! 👋 #Chipmetrics #SiliconSaxonyDay #Semiconductors #ALDep #Metrology #Networking

🚀 New Blog Alert: Enabling Next-Generation Silicon Capacitors with ALD and PillarHall As devices continue to shrink and performance demands soar, the humble silicon capacitor is being pushed to its limits. Traditional MLCCs are struggling to keep up — and that's where Atomic Layer Deposition (ALD) steps in. But how do you ensure conformal, reliable, and scalable dielectric films in deep trenches and porous silicon structures? That’s where Chipmetrics' PillarHall comes into play. Our lateral high aspect ratio test chip enables: ✅ Fast and precise conformality analysis ✅ Quantified step coverage without destructive methods ✅ Shorter development cycles from weeks to days 🔍 Whether you're designing deep trench capacitors, TSVs, or nanoporous architectures, ALD is no longer optional – it’s essential. And with PillarHall, ALD process development shifts from trial-and-error to data-driven acceleration. 👇 Read the full story from the link in the comment 👇 #ALDep #ThinFilm #Semiconductors #PillarHall #Chipmetrified