Chipmetrics

🚀 Meet Chipmetrics at ALD/ALE 2025 Conference in Jeju Island! 🌴 We’re excited to announce that Chipmetrics will be exhibiting at the ALD/ALE 2025 conference from June 22–25 in beautiful Jeju Island, South Korea! 🌏 📍 Visit us at Booth #16, right next to Advantec and Park Systems . ✨ Bring your PillarHall® test chips and stop by our booth to get live measurements using the EP4 Imaging Ellipsometer located at the Park Systems booth and meet the team behind the technology! 👋 Meet our team at the event: Mikko Utriainen, CEO Feng Gao, CTO Zahra Ghaderi, Marketing Manager 💬 Want to book a meeting with us during the event? Reserve your slot from the link in the comments 👇 Let’s talk ALD, and metrology innovation. See you in Jeju! #ALDALE2025 #Chipmetrics #PillarHall #ALDep #Metrology #Chipmetrified #TestedWithPillarHall

🔍 Our Picks Ahead of ALD 2025: Anticipating Atomic Layer Innovation in South Korea 🇰🇷 As ALD 2025 approaches, we’re thrilled to spotlight key presentations where our PillarHall™ test structures are helping researchers tackle the most pressing challenges in conformality, process stability, and 3D integration. This year’s conference highlights how metrology and innovation go hand in hand — from detecting process window shifts early, to understanding growth dynamics in ultra-high aspect ratio features. Several top presentations already feature Chipmetrics’ LHAR structures, and we couldn't be prouder to support this cutting-edge work. Explore our full list and why these presentations matter in our latest blog post: 🔗 Link in the comments 👇 📅 See you at Chipmetrics' booth #16 at ALD/ALE 2025! #ALDALE2025 #PillarHall #TestedWithPillarHall #ALDep #Chipmetrified

🚀 Chipmetrics at Silicon Saxony Day — June 17th, Dresden 🚀 We’re excited to announce that we will be attending Silicon Saxony Day next week on June 17th! This is one of Europe’s leading platforms for networking and exchanging ideas within the semiconductor and microelectronics community. Our team is eager to connect with industry leaders, explore the latest innovations, and discuss how advanced conformality analysis and ALD metrology solutions can drive the next wave of progress in semiconductor manufacturing. 🎯 Want to meet us in Dresden? Thomas Werner from Chipmetrics will be on site all day and would love to meet you! Whether you’re interested in cutting-edge ALD applications, collaboration opportunities, or simply want to learn more about what we do – reach out and connect with Thomas during the event. See you there! 👋 #Chipmetrics #SiliconSaxonyDay #Semiconductors #ALDep #Metrology #Networking

🚀 New Blog Alert: Enabling Next-Generation Silicon Capacitors with ALD and PillarHall As devices continue to shrink and performance demands soar, the humble silicon capacitor is being pushed to its limits. Traditional MLCCs are struggling to keep up — and that's where Atomic Layer Deposition (ALD) steps in. But how do you ensure conformal, reliable, and scalable dielectric films in deep trenches and porous silicon structures? That’s where Chipmetrics' PillarHall comes into play. Our lateral high aspect ratio test chip enables: ✅ Fast and precise conformality analysis ✅ Quantified step coverage without destructive methods ✅ Shorter development cycles from weeks to days 🔍 Whether you're designing deep trench capacitors, TSVs, or nanoporous architectures, ALD is no longer optional – it’s essential. And with PillarHall, ALD process development shifts from trial-and-error to data-driven acceleration. 👇 Read the full story from the link in the comment 👇 #ALDep #ThinFilm #Semiconductors #PillarHall #Chipmetrified

Excited to see my friend and collaborator Anish Philip from Aalto University presenting at the EuroCVD & ALD 2025 Conference in beautiful Catania, Italy 🇮🇹! His talk on Lithium MLD thin films and their conformality highlights some of the great collaborative work we’ve done together, especially using Chipmetrics ’ PillarHall® metrology chips to study and understand film conformality in demanding applications. It’s always rewarding to see our joint research reaching the global stage—wishing Anish a successful and engaging presentation! #EuroCVDALD2025 #MLD #ALD #ThinFilms #Conformality #PillarHall #Chipmetrics #AaltoUniversity #Collaboration #MaterialsScience

🌍We're excited to participate in two major conferences next week—highlighting our latest research in thin-film metrology. 📍 EURO CVD & ALD 2024 🗓️ June 2–5 | Monastery of San Nicolò, Catania, Italy 🎤 Jussi Kinnunen, General Manager at Chipmetrics, will deliver an oral presentation: 🎙️ "Bottleneck-Effect on High Aspect Ratio ALD Thin-Film Conformality" 📍 Optics & Photonics Days 2025 🗓️ June 3–5 | Oulu Music Center, Oulu, Finland 🔬 Jani Karttunen, Head of Product Management at Chipmetrics, will present a poster: 🖼️ "Ellipsometry to Resolve the Thickness of Ultra-Thin Films in a Stack with Micrometre Scale Lateral Resolution" If you're attending either event, don’t miss the chance to connect with our experts! #Chipmetrics #ALDep #PillarHall #Chipmetrified #TestedWithPillarHall #ThinFilmMetrology #OpticsAndPhotonics #EUROCVDALD24

Proud to see our PillarHall Lateral high aspect ratio (LHAR) test chip featured in the Park Systems ISE Image Gallery! This high-resolution Delta Map reveals the exceptional conformality of ALD-deposited Al₂O₃ inside PillarHall LHAR structure. The image demonstrates precise film penetration depth analysis using Imaging Spectroscopic Ellipsometry (ISE), with 1 µm lateral resolution. 🔬 Why it matters: ✔️ Validates conformality in challenging 3D geometries ✔️ Accelerates ALD process development ✔️ Enables predictive insight for deposition in next-gen devices like 3D NAND and DRAM Partnering advanced metrology with application-specific test structures, Chipmetrics provides unmatched solutions for ALD process control and thin film characterization. 🔗 View the full Park Systems ISE Image Gallery from the link in the comment section 👇 #ALDep #PillarHall #TestedWithPillarHall #Chipmetrified #ParkSystems #3DNAND #DRAM #Nanotechnology #Semiconductors #Ellipsometry

📢 Semicon SEA kicked off in Singapore today, with our CTO Feng Gao flying the Chipmetrics flag. He will be roaming the expo floors until Thursday, reach out to him if you wish to learn more about our metrology solutions. #aldep #semiconsea #singapore #semiconductors #PillarHall #Chipmetrified

🔬 Exciting Research Presentation at EMRS Spring 2025 symposium! We’re thrilled to see Dr. Anish Philip from Aalto University presenting his latest research at EMRS 2025 in Symposium L11: Thin Film Batteries. 📅 Date: 28 May 2025 🕐 Time: 13:45–15:30 📍 Room: Symposium L 🎓 Presentation title: Role of lithium precursors in tuning conformality of potential 3D thin-film microbattery components In this study, Dr. Philip and his team explored the impact of various lithium precursors on the conformality and film properties of LiPON and Li-TP – two highly promising materials for 3D thin-film microbatteries. To measure conformality and penetration depth, the team used our PillarHall® lateral high-aspect-ratio test structures, along with SEM and imaging ellipsometry techniques. Their findings reveal the choice of lithium precursor plays a critical role in both conformality and film properties. 👏 We’re proud that PillarHall played a key role in enabling conformality analysis in this impactful work. 📢 Don't miss the presentation if you're attending EMRS 2025 symposium! #TestedWithPillarHall #PillarHall #Chipmetrified #ALDep #EMRS2025

🎉 We’re thrilled to welcome Stefan Polzin as our new Chief Operating Officer at Chipmetrics! With a Master's in Electrical Engineering and an Executive MBA, his extensive experience across semiconductor manufacturing and packaging makes him a fantastic addition to our team. "I'm excited to dive into operational business and truly understand our customers' needs in the pocket wafer space," he says – get to know Stefan better on our blog 👇 Link in the first comment. Welcome aboard, Stefan! We look forward to a bright future together! 🌟 #Welcome #Semiconductors #ALDep #NewHire #Chipmetrified