Chipmetrics

At Semicon Taiwan and want to know more about our products? Visit ANTS and ask from Stanley Su – booth L0216, Nangang Exhibition Center, Hall 1, 4th floor. #SemiconTaiwan #ALDep #PillarHall #Chipmetrified

🤝 Chipmetrics GmbH was delighted to welcome the Business Finland delegation to Dresden, Germany today. This joint event brought together Finnish companies, Silicon Saxony, and local authorities to strengthen collaboration between Finland and Saxony. We are proud to contribute to building bridges between ecosystems and fostering innovation in advanced semiconductor technologies. A big thank you to all participants for the inspiring discussions and valuable exchanges. 🚀 #BusinessFinland #SiliconSaxony #Semiconductors #Networking #Collaboration

Chipmetrics is excited to be part of Semicon Taiwan 2025! 🌏✨ 📅 Program: September 8–12, 2025 📍 Exhibition: September 10–12, TaiNEX 1&2, Taipei You can find us at our distributor Applied Nano Technology Science, Inc. booth L0216. We look forward to meeting industry experts, customers, and partners to discuss how our advanced test chips and wafers enable innovation in thin-film metrology and semiconductor process control. 👉 See you in Taipei! #ALDep #PillarHall #Chipmetrified #SemiconTaiwan

🌟 Chipmetrics is proud to sponsor the ALPIN Workshop 2025 in Gießen, Germany! 🌟 The workshop brings together leading experts in atomic layer processing, thin films, and nanostructures, creating a unique platform for knowledge exchange and collaboration. Our Head of Metrology Wafer Business, Thomas Werner, will be representing Chipmetrics at the event. Don’t miss the chance to connect with him and learn more about our advanced metrology solutions for ALD, ALE, and ASD processes. 📅 Date: September 2–3, 2025 📍 Location: Justus Liebig University, Gießen, Germany We look forward to engaging discussions and exciting new ideas! #ALDep #PillarHall #Chipmetrified #TestedWithPillarHall

🚀 Chipmetrics Expands its Metrology Portfolio for Next-Gen Semiconductor Processes We’re excited to announce three powerful additions to our lineup of advanced metrology tools – designed to accelerate prototyping, enhance precision analysis, and shorten R&D cycles for cutting-edge thin-film processes. 🔍 New solutions at a glance: 1️⃣ ASD-1b – Next-generation Area Selective Deposition (ASD) test chip with high-resolution narrow lines, tricolor material layout, and compatibility with ALD, CVD, and electroless plating. 2️⃣ High Surface Area (HSA) Wafer – Deep trench architecture boosting surface area up to 300×, enabling ultra-sensitive thin-film studies. 3️⃣ Pre-Coated High Aspect Ratio Test Structures – VHAR1 & PillarHall® chips with realistic ALD coatings for true-to-application conformality and uniformity evaluation. 💡 These innovations give engineers and researchers unmatched insight into selectivity, defectivity, and material behavior under realistic process conditions, helping them bring new semiconductor processes to market faster. 📅 Available now – Learn more about our new portfolio from the link in the first comment 👇 #ALDep #Chipmetrified #PillarHall #Metrology #ALD

🚀 Struggling with ALD in complex 3D structures? Our latest blog post breaks down how the PillarHall® chip simplifies Atomic Layer Deposition (ALD) process development and monitoring in high-aspect-ratio (HAR) features. PillarHall helps you: ✅ Optimize ALD parameters ✅ Visualize conformality and penetration ✅ Maintain long-term process stability ✅ Predict real-world performance with our HAR Calculator 💡 Ready to bring more precision to your ALD processes? Discover how PillarHall can support your next breakthrough. 🔍 Read the full post from the link in the first comment 👇 #ALDep #PillarHall #TestedWithPillarHall #Chipmetrified

At ALD/ALE 2025 – our PillarHall™ 3D model on display! This mini replica shows how our lateral high aspect ratio test structure work. A fun and simple way to explain serious metrology. 📍 Visit us at booth #16 to learn more! #ALDALE2025 #ALDep #PillarHall #TestedWithPillarHall #Chipmetrified

📍 Live from ALD/ALE 2025! We’re excited to be part of ALD/ALE 2025, showcasing Chipmetrics’ cutting-edge thin-film metrology solutions right next to Park Systems ( #16 & #17 booths). 🔬We are featuring live PillarHall™ sample measurements using Park Systems’ Spectroscopic Imaging Ellipsometer – a great opportunity to see our lateral high aspect ratio test structures in action. Come explore what it means to be #Chipmetrified 🔍 #ALDep #PillarHall #ALDALE2025 #PillarHall #TestedWithPillarHall

🚀 Ready to kick off ALD/ALE 2025 in Jeju! Chipmetrics is all set at Booth #16 at the Jeju International Convention Center (ICC) for the ALD/ALE 2025 conference. The exhibition opens today, June 22nd at 6 PM – come meet us and discover our exciting new offerings including high surface area wafer, a new ASD chip for Area Selective Deposition studies, and pre-coated high aspect ratio test chips ! We’re excited to connect with the ALD community here in beautiful Jeju – see you soon! #ALDALE2025 #ALDep #TestedWithPillarHall #Chipmetrified #PillarHall

☀️Hyvää Juhannusta☀️ ☀️Happy Midsummer☀️ #PillarHall #ALDep #Chipmetrified